Safety integrity levels model for IEC 61508 - Examination of modes of operation -

IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

Volumn E83-A, Issue 5, 2000, Pages 863-865

  Kato, Eiichi ^a  

^a Fuji Planning Corporation   (Japan)

Author keywords

Frequency of harmful event; Functional safety; Modes of operation; Programmable electronic; Safety integrity level; Safety related system

Indexed keywords

PROGRAMMABLE ELECTRONIC; SAFETY INTEGRITY LEVEL; SAFETY RELATED SYSTEM;

ACCIDENT PREVENTION; ALGORITHMS; ESTIMATION; FREQUENCIES; MATHEMATICAL MODELS;

RELIABILITY THEORY;

EID: 0034187716     PISSN: 09168508     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (4)

1. IEC 61508, part l, 2, 3,4 and 5, IEC, Geneva, Dec. 1998.
2. Draft IEC 61508; part l, Version 3.0 01/05/97; Part 4, version 3.0 12/02/97, May 1997.
3. E.Kato, Y.Sato, and M.Horigome, "Safety integrity levels model for draft IEC 61508-Functional safety," lEICETrans., vol.J82-A, no.2, pp.247-255, Feb. 1999.
4. FDIS IEC 61508; part 4, IEC, Geneva, July 1998.