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Volumn 15, Issue 2, 2000, Pages 654-660

Cost related reliability measures for power system equipment

Author keywords

[No Author keywords available]

Indexed keywords

COST EFFECTIVENESS; INDUSTRIAL ECONOMICS; MARKOV PROCESSES; MATHEMATICAL MODELS; RELIABILITY;

EID: 0034186834     PISSN: 08858950     EISSN: None     Source Type: Journal    
DOI: 10.1109/59.867155     Document Type: Article
Times cited : (42)

References (15)
  • 6
    • 33749875465 scopus 로고
    • A unifying approach to performance and reliability objectives
    • M. Bonatti, Ed: Elsevier Science Publishers B.V., North Holland
    • Y Levy and P. E. Wirth, "A unifying approach to performance and reliability objectives," in Teletrafic Science for New Cost Effective Systems, Networks and Services, M. Bonatti, Ed: Elsevier Science Publishers B.V., North Holland, 1989, pp. 1173-1179.
    • (1989) Teletrafic Science for New Cost Effective Systems, Networks and Services , pp. 1173-1179
    • Levy, Y.1    Wirth, P.E.2
  • 9
    • 0017983601 scopus 로고
    • Performance-related reliability measures for computing systems
    • M. D. Baudry, "Performance-related reliability measures for computing systems," IEEE Trans. Comput., vol. C-27, no. 6, pp. 540-547, 1978.
    • (1978) IEEE Trans. Comput. , vol.C-27 , Issue.6 , pp. 540-547
    • Baudry, M.D.1
  • 10
    • 0025507290 scopus 로고
    • Performability analysis using semi-Markov reward process,"
    • R. Marie, Ciardo, B. Sericola, and K. S. Trivedi, "Performability analysis using semi-Markov reward process," IEEE Trans. CompuL, vol. C-39, no. 10, pp. 1251-1264, 1990.
    • (1990) IEEE Trans. CompuL , vol.C-39 , Issue.10 , pp. 1251-1264
    • Marie, R.1    Ciardo2    Sericola, B.3    Trivedi, K.S.4
  • 12
    • 0028533108 scopus 로고
    • Stiffness-tolerant methods for transient analysis of stiff Markov chains
    • J. K. Malhotra, J. K. Muppala, and K. S. Trivedi, "Stiffness-tolerant methods for transient analysis of stiff Markov chains," Microelectron. Reliab., vol. 34, no. 11, pp. 1825-1841, 1994.
    • (1994) Microelectron. Reliab. , vol.34 , Issue.11 , pp. 1825-1841
    • Malhotra, J.K.1    Muppala, J.K.2    Trivedi, K.S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.