Latent class analysis of respondent scalability

Quality and Quantity

Volumn 34, Issue 2, 2000, Pages 177-191

  Van Den Wittenboer, G ^a   Hox, J J ^b   De Leeuw, E D ^c  

^a UNIVERSITY OF AMSTERDAM   (Netherlands)

^b UTRECHT UNIVERSITY   (Netherlands)

^c MethodikA   (Netherlands)

Author keywords

Latent class analysis; Measurement error; Person fit research; Respondent error

Indexed keywords

EID: 0034178767     PISSN: 00335177     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1004775921860     Document Type: Article

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