Embedded systems under shear: Relationship between shear-induced modes and frictional behavior

Europhysics Letters

Volumn 50, Issue 3, 2000, Pages 326-332

  Porto, M ^a   Urbakh, M ^a   Klafter, J ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0034178087     PISSN: 02955075     EISSN: None     Source Type: Journal    
DOI: 10.1209/epl/i2000-00274-6     Document Type: Article

References (36)

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34. The modes of motion show a rather weak dependence on the initial conditions, and this "memory" gets completly lost in the chaotic regime or by changing the mode by increasing the stage velocity. Only with quite artificial initial conditions a different shearou wave vector can be prepared, cf. [16].
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36. In this regime, the slight dependence of the mean friction on the defect parameter h is due to the fact that the mean friction force depends on which particle i is stuck at the defect: The mean friction force is highest if the last particle [i = 1] arriving at the defect is stuck, and it decreases the deeper the defect is and hence the earlier the embedded system is stuck. If the defect is deep enough [h ≳ 2] so that already the first particle [i = N] arriving at the defect is stuck, the mean friction force saturates.