XPS and AES studies of ITO thin films

Cailiao Yanjiu Xuebao/Chinese Journal of Materials Research

Volumn 14, Issue 2, 2000, Pages 173-178

  Chen, Meng ^a   Pei, Zhiliang ^a   Bai, Xuedong ^a   Huang, Rongfang ^a   Wen, Lishi ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; INDIUM COMPOUNDS; IONS; OXYGEN; TIN; X RAY PHOTOELECTRON SPECTROSCOPY;

CHEMICAL STATE; GAUSS SIMULATION;

SEMICONDUCTING FILMS;

EID: 0034172057     PISSN: 10053093     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (9)