메뉴 건너뛰기




Volumn 14, Issue 2, 2000, Pages 127-132

Fault diagnosis competitive neural network with prioritized modification rule of connection weights

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER ARCHITECTURE; COMPUTER CONTROL SYSTEMS; COMPUTER SIMULATION; DECISION MAKING; DYNAMIC PROGRAMMING; NUMERICAL CONTROL SYSTEMS;

EID: 0034171905     PISSN: 09541810     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0954-1810(00)00004-2     Document Type: Article
Times cited : (7)

References (10)
  • 1
    • 0020496768 scopus 로고
    • Design for testability - A survey
    • Williams T.W., Parker K.P. Design for testability - a survey. Proc. IEEE. 71:(1):1983;98-112.
    • (1983) Proc. IEEE , vol.71 , Issue.1 , pp. 98-112
    • Williams, T.W.1    Parker, K.P.2
  • 2
    • 0025456824 scopus 로고
    • Application of heuristic search and information theory to sequential fault diagnosis
    • Pattipati K.R., Alexandridis M.C. Application of heuristic search and information theory to sequential fault diagnosis. IEEE Trans Systems, Man, Cybernetics. 20:(4):1990;872-887.
    • (1990) IEEE Trans Systems, Man, Cybernetics , vol.20 , Issue.4 , pp. 872-887
    • Pattipati, K.R.1    Alexandridis, M.C.2
  • 3
    • 0015403290 scopus 로고
    • Optimal binary identification procedures
    • Garery M.R. Optimal binary identification procedures. SIAM J. Appl. Math. 23:(2):1992;173-186.
    • (1992) SIAM J. Appl. Math. , vol.23 , Issue.2 , pp. 173-186
    • Garery, M.R.1
  • 4
    • 0026925395 scopus 로고
    • Dynamic fault tree models for fault tolerant computer systems
    • Dugan J.B., Bavuso S.J., Boyed M. Dynamic fault tree models for fault tolerant computer systems. IEEE Trans. Reliability. 41:(3):1992;363-376.
    • (1992) IEEE Trans. Reliability , vol.41 , Issue.3 , pp. 363-376
    • Dugan, J.B.1    Bavuso, S.J.2    Boyed, M.3
  • 6
    • 0342652899 scopus 로고
    • Feature discovery by competitive learning
    • Rumelhart D.E., Zipser D. Feature discovery by competitive learning. Cognitive Sci. 1987;11.
    • (1987) Cognitive Sci. , pp. 11
    • Rumelhart, D.E.1    Zipser, D.2
  • 7
    • 0030109137 scopus 로고    scopus 로고
    • A modular neural network approach to fault diagnosis
    • Rodriguez C., et al. A modular neural network approach to fault diagnosis. IEEE Trans. Neural Networks. 7:(2):1996;326-340.
    • (1996) IEEE Trans. Neural Networks , vol.7 , Issue.2 , pp. 326-340
    • Rodriguez, C.1
  • 9
    • 0043251098 scopus 로고
    • Center for Sys. Sci. Department of Electrical Engineering, Yale University, New Haven, CT, Tech. Rep. 8815, August
    • Narendara KS, Pathasarathy K. A diagrammatic representation of back propagation. Center for Sys. Sci. Department of Electrical Engineering, Yale University, New Haven, CT, Tech. Rep. 8815, August 1988.
    • (1988) A Diagrammatic Representation of Back Propagation
    • Narendara, K.S.1    Pathasarathy, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.