X-ray photoelectron spectroscopy and near-edge X-ray-absorption fine structure of C60 polymer films

Applied Physics A: Materials Science and Processing

Volumn 70, Issue 4, 2000, Pages 387-390

  Ramm, M ^a   Ata, M ^a   Gross, T ^b   Unger, W ^b  

^a SONY CORPORATION   (Japan)

^b BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CARBON; ELECTRONIC STRUCTURE; OXYGEN; POLYMERIZATION; SURFACES; X RAY PHOTOELECTRON SPECTROSCOPY;

AMORPHOUS CARBON; NEAR EDGE X RAY ABSORPTION FINE STRUCTURE; POST PLASMA FUNCTIONALIZATION;

FULLERENES;

EID: 0034171766     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390051053     Document Type: Article

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