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Journal of Optics (India)

Volumn 29, Issue 2, 2000, Pages 85-93

Interferometric measurement of thickness of thin films of Formvar deposited on glass plates

(4) Shukla, R P a Kumar, Sanjiva a Chowdhury, A b Gupta, P D b

a BHABHA ATOMIC RESEARCH CENTRE (India)

b RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY (India)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; EVAPORATION; INTERFEROMETRY; OPTICAL COATINGS; OPTICAL GLASS; REFLECTION; THICKNESS MEASUREMENT; ULTRAVIOLET SPECTROSCOPY; X RAY SPECTROSCOPY; THICKNESS GAGES; THIN FILMS; VACUUM EVAPORATION;

AIR GAP; FIZEAU FRINGES; FORMVAR FILM; DISTANCE MEASURING; EXPERIMENTAL SET UP; EXTREME ULTRAVIOLETS; INTERFEROMETRIC MEASUREMENT; RESEARCH APPLICATIONS; THIN PLASTIC FILMS; THREE-WAVELENGTHS; TRANSMISSION MODE;

PLASTIC FILMS; GLASS;

EID: 0034165867 PISSN: 09700374 EISSN: None Source Type: Journal
DOI: 10.1007/bf03354675 Document Type: Article

Times cited : (6)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.