The future of EMC technology

IEICE Transactions on Communications

Volumn E83-B, Issue 3, 2000, Pages 435-443

  Nitta, Shuichi ^a  

^a TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY   (Japan)

Author keywords

EMC (electromagnetic compatibility); Safety

Indexed keywords

ACCIDENT PREVENTION; ELECTROMAGNETIC FIELD MEASUREMENT; ELECTROMAGNETIC WAVE EMISSION; ELECTRONIC EQUIPMENT; INTEGRATED CIRCUIT LAYOUT; PRINTED CIRCUIT BOARDS; SYSTEMS ANALYSIS; TECHNOLOGY TRANSFER;

DESIGN TECHNOLOGY; NOISE IMMUNITY; SYSTEMS SAFETY;

ELECTROMAGNETIC COMPATIBILITY;

EID: 0034157019     PISSN: 09168516     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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