Structural analysis of Si(111)-7×7 domain boundaries with takayanaki cores

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 18, Issue 2, 2000, Pages 320-324

  Zhao, Y F ^a   Zhang, Z H ^b   Yang, H Q ^a   Xue, Z Q ^a   Pang, S J ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^b PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL ATOMIC STRUCTURE; CRYSTAL GROWTH; CRYSTAL LATTICES; CRYSTAL SYMMETRY; GRAIN BOUNDARIES; MATHEMATICAL MODELS; SCANNING TUNNELING MICROSCOPY; STACKING FAULTS; SURFACE STRUCTURE; SURFACE TREATMENT;

ATOMIC STRUCTURAL MODELS; DIMER ADATOM STACKING FAULT; LATTICE MATCHING; REGULAR DOMAIN BOUNDARIES; TAKAYANAKI CORES;

SEMICONDUCTING SILICON;

EID: 0034155664     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.582186     Document Type: Article

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