Molecular deformation in spider dragline silk subjected to stress

Polymer

Volumn 41, Issue 3, 2000, Pages 1223-1227

  Sirichaisit, J ^a   Young, R J ^a   Vollrath, F ^b  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b AARHUS UNIVERSITY   (Denmark)

Author keywords

Dragline silk; Nephila edulis; Raman spectra

Indexed keywords

AMORPHOUS MATERIALS; CRYSTAL ORIENTATION; CRYSTALLINE MATERIALS; MOLECULES; MORPHOLOGY; PROTEINS; RAMAN SPECTROSCOPY; STRAIN; TENSILE STRESS; X RAY DIFFRACTION ANALYSIS;

MOLECULAR DEFORMATION; NEPHILA EDULIS; SMALL ANGLE X RAY DIFFRACTION; SPIDER DRAGLINE SILK; WIDE ANGLE X RAY DIFFRACTION;

SILK;

POLYMER; SILK;

ARTICLE; MECHANICS; MOLECULAR DYNAMICS; PROTEIN ANALYSIS; RAMAN SPECTROMETRY; SCANNING ELECTRON MICROSCOPY; SPIDER; X RAY DIFFRACTION;

DEFORMATION; FIBER PROPERTY; SPIDER SILK;

EID: 0034142611     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0032-3861(99)00293-1     Document Type: Article

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