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Volumn 80, Issue 2, 2000, Pages 73-78

New 1/1 cubic approximant phases in the Al-Cu-Ru-Si system studied by electron diffraction and high-resolution electron microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; ELECTRON DIFFRACTION; HIGH RESOLUTION ELECTRON MICROSCOPY; STRUCTURE (COMPOSITION); TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034142494     PISSN: 09500839     EISSN: None     Source Type: Journal    
DOI: 10.1080/095008300176326     Document Type: Article
Times cited : (2)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.