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Volumn 80, Issue 2, 2000, Pages 73-78
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New 1/1 cubic approximant phases in the Al-Cu-Ru-Si system studied by electron diffraction and high-resolution electron microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMS;
ELECTRON DIFFRACTION;
HIGH RESOLUTION ELECTRON MICROSCOPY;
STRUCTURE (COMPOSITION);
TRANSMISSION ELECTRON MICROSCOPY;
ALUMINUM COPPER RUBIDIUM SILICON SYSTEM;
CUBIC APPROXIMANT PHASE;
ALUMINUM ALLOYS;
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EID: 0034142494
PISSN: 09500839
EISSN: None
Source Type: Journal
DOI: 10.1080/095008300176326 Document Type: Article |
Times cited : (2)
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References (9)
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