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Volumn 21, Issue 2, 2000, Pages 82-84

A LDMOS technology compatible with CMOS and passive components for integrated RF power amplifiers

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC BREAKDOWN; ELECTRIC INDUCTORS; GATES (TRANSISTOR); MOSFET DEVICES; NETWORK COMPONENTS; POWER AMPLIFIERS; SEMICONDUCTING SILICON; THRESHOLD VOLTAGE; TRANSCEIVERS; WIRELESS TELECOMMUNICATION SYSTEMS;

EID: 0034141004     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.821677     Document Type: Article
Times cited : (19)

References (5)
  • 1
    • 0029235282 scopus 로고
    • Future directions in silicon IC's for rf personal communications
    • P. R. Gray and R. G. Meyer, "Future directions in silicon IC's for rf personal communications," in Proc. IEEE Custom IC Conf., 1995, pp. 83-90.
    • (1995) Proc. IEEE Custom IC Conf. , pp. 83-90
    • Gray, P.R.1    Meyer, R.G.2
  • 2
    • 3843102586 scopus 로고    scopus 로고
    • A single-chip 900-MHz spread-spectrum wireless transceiver in a 1-μm CMOS, part I and II
    • Apr.
    • A. Rofougaran et al., "A single-chip 900-MHz spread-spectrum wireless transceiver in a 1-μm CMOS, part I and II," IEEE J. Solid-State Circuits, vol. 33, pp. 515-547, Apr. 1998.
    • (1998) IEEE J. Solid-state Circuits , vol.33 , pp. 515-547
    • Rofougaran, A.1
  • 3
    • 0030397063 scopus 로고    scopus 로고
    • High performance silicon LDMOS technology for 2 GHz rf power amplifier applications
    • A. Wood, C. Dragon, and W. Burger, "High performance silicon LDMOS technology for 2 GHz rf power amplifier applications," in IEEE IEDM Tech. Dig., 1996, pp. 87-90.
    • (1996) IEEE IEDM Tech. Dig. , pp. 87-90
    • Wood, A.1    Dragon, C.2    Burger, W.3
  • 4
    • 0030658212 scopus 로고    scopus 로고
    • A performance comparison between new reduced surface drain 'RSD' LDMOS and RESURF and conventional planar power devices rated at 20-V
    • T. Efland et al., "A performance comparison between new reduced surface drain 'RSD' LDMOS and RESURF and conventional planar power devices rated at 20-V," in IEEE Int. Symp. Power Semiconductor Devices and ICs, 1997, pp. 185-188.
    • (1997) IEEE Int. Symp. Power Semiconductor Devices and ICs , pp. 185-188
    • Efland, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.