Reflection properties of oriented thin CdS films formed by laser ablation

Thin Solid Films

Volumn 360, Issue 1-2, 2000, Pages 222-228

  Dushkina, N M ^a   Ullrich, B ^b   Sakai, H ^c   Segawa, Y ^b   Hibino, K ^a   Eiju, T ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b RIKEN   (Japan)

^c Hiroshima University   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; BIREFRINGENCE; CRYSTALLOGRAPHY; GLASS; LASER ABLATION; LIGHT POLARIZATION; LIGHT REFLECTION; MATHEMATICAL MODELS; SURFACES; THIN FILMS;

ANGLE OF INCIDENCE; DICHROISM; FRESNEL REFLECTION; GLASS SUBSTRATE; LASER LIGHT; ORIENTED THIN FILMS;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0034140999     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00965-7     Document Type: Article

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