Chemical and topographical surface analysis of five different implant abutments

Clinical Oral Implants Research

Volumn 11, Issue 1, 2000, Pages 44-50

  Sawase, Takashi ^a,b   Wennerberg, Ann ^a   Hallgren, Carin ^a   Albrektsson, Tomas ^a   Baba, Koumei ^c  

^a UNIVERSITY OF GOTHENBURG   (Sweden)

^b NAGASAKI UNIVERSITY   (Japan)

^c Technology Center of Nagasaki   (Japan)

Author keywords

Auger Electron Spectroscopy (AES); Chemical composition; Confocal laser scanning profilometer; Surface analysis; Surface roughness

Indexed keywords

CARBON; PHOSPHORUS; SILICON DIOXIDE; SULFUR; TITANIUM; TITANIUM DIOXIDE;

ARTICLE; CHEMISTRY; COMPARATIVE STUDY; CONFOCAL MICROSCOPY; DENTURE; ELECTRON PROBE MICROANALYSIS; METALLURGY; SURFACE PROPERTY; THREE DIMENSIONAL IMAGING;

CARBON; DENTAL ABUTMENTS; ELECTRON PROBE MICROANALYSIS; IMAGING, THREE-DIMENSIONAL; METALLURGY; MICROSCOPY, CONFOCAL; PHOSPHORUS; SILICON DIOXIDE; SULFUR; SURFACE PROPERTIES; TITANIUM;

EID: 0034139609     PISSN: 09057161     EISSN: None     Source Type: Journal    
DOI: 10.1034/j.1600-0501.2000.011001044.x     Document Type: Article

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