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Volumn 20, Issue 1, 2000, Pages 1-6
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Study of 6H-SiC MOSFET
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
ANALYSIS;
FABRICATION;
MOS DEVICES;
SECONDARY ION MASS SPECTROMETRY;
SILICON CARBIDE;
MASS SPECTRUM ANALYSIS;
FIELD EFFECT TRANSISTORS;
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EID: 0034139099
PISSN: 10003819
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (2)
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References (7)
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