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Volumn 21, Issue 2, 2000, Pages 120-126
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New measuring method for material parameters of nanometer structure devices
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
DOPING (ADDITIVES);
MONTE CARLO METHODS;
PARAMETER ESTIMATION;
SEMICONDUCTOR QUANTUM WELLS;
STRUCTURAL ANALYSIS;
MATERIALS STRUCTURE PARAMETERS;
NANOMETER STRUCTURE DEVICES;
NANOSTRUCTURED MATERIALS;
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EID: 0034139004
PISSN: 02534177
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
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Times cited : (1)
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References (8)
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