Simple amplitude and phase measuring technique for ultrahigh-repetition-rate lasers

IEEE Photonics Technology Letters

Volumn 12, Issue 2, 2000, Pages 187-189

  Kockaert, P ^a   Peeters, M ^b   Coen, S ^a   Emplit, Ph ^a   Haelterman, M ^a   Deparis, O ^c  

^a UNIVERSITÉ LIBRE DE BRUXELLES   (Belgium)

^b LUCENT TECHNOLOGIES   (United States)

^c FACULTÉ POLYTECHNIQUE DE MONS   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; LASER MODES; LASER PULSES; OPTICAL INSTRUMENT LENSES; PHOTODIODES;

CONTINUOUS WAVE ULTRAHIGH REPETITION RATE LASERS;

CONTINUOUS WAVE LASERS;

EID: 0034135719     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/68.823512     Document Type: Article

References (6)

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2. C. Iaconis and I. A. Walmsley, "Spectral phase interferometry for direct electric-field reconstruction of ultrashort optical pulses," Opt. Lett., vol. 23, no. 10, pp. 792-794, May 1998.
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4. V. Wong and I. A. Walmsley, "Analysis of ultrashort pulse-shape measurement using linear interferometers," Opt. Lett., vol. 19, no. 4, pp. 287-289, Feb. 1994.
5. S. Prein, S. Diddams, and J.-C. Diels, "Complete characterization of femtosecond pulses using an all-electronic detector," Opt. Commun., vol. 123, pp. 567-573, Feb. 1996.
6. J. Debeau, B. Kowalski, and R. Boittin, "Simple method for the complete characterization of an optical pulse," Opt. Lett., vol. 23, no. 22, pp. 1784-1786, Nov. 1998.