Skew detection and reconstruction based on maximization of variance of transition-counts

Pattern Recognition

Volumn 33, Issue 2, 2000, Pages 195-208

  Chen, Yi Kai ^a   Wang, Jhing Fa ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Scanning line; Scanning line model; Skew detection; Skew reconstruction; SNR; Transition counts; Transition counts variance

Indexed keywords

FEATURE EXTRACTION; MATHEMATICAL MODELS; OPTIMIZATION; PATTERN RECOGNITION SYSTEMS; SIGNAL TO NOISE RATIO;

SKEW DETECTION; SKEW RECONSTRUCTION; TRANSITION COUNTS VARIANCE;

OPTICAL CHARACTER RECOGNITION;

EID: 0034135219     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0031-3203(99)00045-X     Document Type: Article

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