Scanning tunneling microscopy of films of amorphous carbon doped with copper

Semiconductors

Volumn 34, Issue 2, 2000, Pages 217-220

  Golubok, A O ^a   Gorbenko, O M ^a   Zvonareva, T K ^b   Masalov, S A ^a   Rozanov, V V ^a   Yastrebov, S G ^b   Ivanov Omskii, V I ^b  

^a INSTITUTE FOR ANALYTICAL INSTRUMENTATION   (Russian Federation)

^b IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0034134331     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1187935     Document Type: Article

References (7)

1. V. I. Ivanov-Omskiǐ, A. O. Golubok, S. G. Yastrebov, et al., Pis'ma Zh. Tekh. Fiz. 24, 28 (1998).
2. J. G. Simmons, J. Appl. Phys. 34, 2581 (1963).
3. G. A. J. Amaratunga and S. R. P. Silva, Appl. Phys. Lett. 68, 2529 (1996).
4. R. D. Forrest, A. P. Burden, S. R. P. Silva, et al., Appl. Phys. Lett. 73, 3784 (1998).
5. C. Arena, B. Kleinsorge, J. Robertson, et al., J. Appl. Phys. 85, 1609 (1999).
6. D. V. Likharev and K. K. Averin, Zh. Éksp. Teor. Fiz. 90, 733 (1986).
7. V. I. Ivanov-Omskiǐ, A. B. Lodygin, A. A. Sitnikova, A. A. Suvorova, S. G. Yastrebov, and A. V. Tolmachev, in Diamond and Diamond-like Film Applications, Ed. by P. Gielisse, V. I. Ivanov-Omskiǐ, G. Popovichi, and V. Prelas (Technomic, Lancaster-Basel, 1998), p. 486.