Automated identification of symmetry in CBED patterns: A genetic approach

Ultramicroscopy

Volumn 84, Issue 1-2, 2000, Pages 47-56

  Hu, G B ^a   Peng, L M ^a,b   Yu, Q F ^c   Lu, H Q ^c  

^a INSTITUTE OF PHYSICS   (China)

^b PEKING UNIVERSITY   (China)

^c INSTITUTE OF AUTOMATION   (China)

Author keywords

CBED; Image processing; Symmetry

Indexed keywords

CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; ELECTRON BEAMS; ELECTRON DIFFRACTION; FUNCTIONS; GENETIC ALGORITHMS; IMAGE PROCESSING; SINGLE CRYSTALS;

CONVERGENT BEAM ELECTRON DIFFRACTION (CBED); OBJECTIVE FUNCTIONS;

SILICON;

SILICON;

ALGORITHM; ARTICLE; AUTOMATION; CONTROLLED STUDY; CORRELATION FUNCTION; CRYSTAL; ELECTRON BEAM; ELECTRON DIFFRACTION; GENETICS; IMAGE PROCESSING; PATTERN RECOGNITION; ROTATION;

EID: 0034119085     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(00)00006-1     Document Type: Article

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