Characterization and structural analysis of differently prepared samples of dehydrated VPI-5

Microporous and Mesoporous Materials

Volumn 34, Issue 1, 2000, Pages 99-113

  De Oñate Martínez, Javier ^a   McCusker, Lynne B ^a   Baerlocher, Christian ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

Dehydrated VPI 5; MAS NMR; Rietveld refinement; Thermal behavior; VFI

Indexed keywords

CATALYST; ZEOLITE;

EID: 0034118733     PISSN: 13871811     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1387-1811(99)00165-1     Document Type: Article

References (26)

1. McCusker L.B., Baerlocher Ch., Jahn E., Bülow M. Zeolites. 11:1991;308.
2. Brunner G.O. Zeolites. 10:1990;612.
3. Dessau R., Schlenker J.L., Higgins J.B. Zeolites. 10:1990;522.
4. Richardson J.W. Jr., Vogt E.T.C. Zeolites. 12:1992;13.
5. Vogt E.T.C., Richardson J.W. Jr. J. Solid State Chem. 87:1990;469.
6. Prassad S., Balakrishnan I. Inorg. Chem. 29:1990;4830.
7. Ulan J.G., Szostak R., Sørby K., Gronsky R. Mater. Res. Soc. Symp. Proc. 183:1990;317.
8. Wu Y., Chmelka B.F., Pines A., Davis M.E., Grobet P.J., Jacobs P.A. Nature. 346:1990;550.
9. Jelinek R., Chmelka B.F., Wu Y., Davis M.E., Ulan J.G., Gronsky R., Pines A. Catal. Lett. 15:1992;65.
10. Martens J.A., Feijen E., Lievens J.L., Grobet P.J., Jacobs P.A. J. Phys. Chem. 95:1991;10 025.
11. Perez J.O., Chu P.J., Clearfield A. J. Phys. Chem. 95:1991;9994.
12. Richardson J.W. Jr., Smith J.V., Pluth J.J. J. Phys. Chem. 93:1989;8212.
13. Poojary D.M., Perez J.O., Clearfield A. J. Phys. Chem. 96:1992;7709.
14. Jahn E., Mueller D., Richter-Mendau J. Occelli M.L., Robson H. Synthesis of Microporous Materials. 1992;248 Van Nostrand Reinhold, New York.
15. de Oñate Martínez J., Falamaki C., McCusker L.B., Baerlocher Ch. Micropor. Mesopor. Mater. 28:1999;261.
16. J. de Oñate Martínez, PhD Thesis, ETH, Zürich, Switzerland, 1997 (in English).
17. Davis M.E., Young D. Stud. Surf. Sci. Catal. 60:1991;63.
18. Fitch A.N. Mater. Sci. Forum. 228-231:1996;219.
19. Hodeau J.L., Bordet P., Anne M., Prat A., Fitch A.N., Dooryhee E., Vaughan G., Freund A. SPIE Proc. 3448:1998;353.
20. Karlsson A., Akporiaye D., Stöcker M. Micropor. Mater. 4:1995;31.
21. He H., Klinowski J. J. Phys. Chem. 98:1994;1192.
22. Li H.-X., Davis M.E. Catal. Today. 19:1994;61. and references cited therein.
23. Young R.A. The Rietveld Method. 1993;Oxford University Press.
24. Baerlocher Ch. X-Ray Rietveld System XRS-82. 1982;Institut für Kristallographie und Petrographie, ETH, Zürich.
25. Baerlocher Ch., Hepp A., Meier W.M. Distance Least Squares Refinement Program DLS-76. 1977;Institut für Kristallographie und Petrographie, ETH, Zürich.
26. Richardson J.W. Jr., Pluth J.J., Smith J.V. Acta Crystallogr. Sect. B: 44:1988;367.