A storage Dewar near-field scanning optical microscope

Ultramicroscopy

Volumn 83, Issue 1-2, 2000, Pages 25-31

  Eytan, G ^a   Yayon, Y ^a   Bar Joseph, I ^a   Rappaport, M L ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

Low temperature; Near field microscopy; Noise in optical fibers

Indexed keywords

DEWARS; HETEROJUNCTIONS; LIGHT INTERFERENCE; OPTICAL FIBERS; OPTICAL MATERIALS; OPTICAL RESOLVING POWER; SCANNING; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE;

ALUMINUM GALLIUM ARSENIDE; NEAR-FIELD SCANNING OPTICAL MICROSCOPY; STORAGE DEWARS;

OPTICAL MICROSCOPY;

GLASS FIBER;

ARTICLE; FORCE; ILLUMINATION; LUMINESCENCE; NOISE; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SHEAR RATE; TEMPERATURE;

EID: 0034116571     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00167-9     Document Type: Article

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