Crystal structure of the low-temperature phase of β Cu1.75 Se analysed by electron diffraction

Journal of Electron Microscopy

Volumn 49, Issue 1, 2000, Pages 25-29

  Okada, Yuji ^a   Ohtani, Tsukio ^a   Yokota, Yasuhiro ^a   Tachibana, Yukio ^a   Morishige, Kunimitsu ^a  

^a OKAYAMA UNIVERSITY OF SCIENCE   (Japan)

Author keywords

Copper selenide; Electron diffraction; Order disorder transition; Phase transition; Resistivity; X ray diffraction

Indexed keywords

COPPER COMPOUNDS; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; ELECTRONS; FLUORSPAR; ORDER DISORDER TRANSITIONS; SELENIUM COMPOUNDS; TEMPERATURE;

COPPER SITES; CRYSTALS STRUCTURES; DIFFRACTION MEASUREMENTS; LOW TEMPERATURE PHASE; ORDER-DISORDER TRANSITION; RESISTIVITY; TWO PHASE MIXTURES; X- RAY DIFFRACTIONS; X-RAY DIFFRACTION MEASUREMENTS;

X RAY DIFFRACTION;

EID: 0034112611     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023788     Document Type: Article

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