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Volumn 238, Issue 1, 2000, Pages 45-47

Microtribological properties of ultrathin C60 films grown by molecular beam epitaxy

Author keywords

C60; Microtribology; Molecular beam epitaxy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON; CONDENSATION; EPITAXIAL GROWTH; FILM GROWTH; MOLECULAR BEAM EPITAXY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; TRIBOLOGY; ULTRATHIN FILMS;

EID: 0034099971     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0043-1648(99)00339-7     Document Type: Conference Paper
Times cited : (25)

References (10)
  • 2
    • 0030293505 scopus 로고    scopus 로고
    • Field ion microscopy of microdeformation induced by metallic contacts
    • Ohmae N. Field ion microscopy of microdeformation induced by metallic contacts. Philos. Mag. A. 74:1996;1319-1327.
    • (1996) Philos. Mag. a , vol.74 , pp. 1319-1327
    • Ohmae, N.1
  • 6
    • 0027666487 scopus 로고
    • Nanotribology studies of carbon surfaces by force microscopy
    • Mate C.M. Nanotribology studies of carbon surfaces by force microscopy. Wear. 168:1993;17-20.
    • (1993) Wear , vol.168 , pp. 17-20
    • Mate, C.M.1
  • 9
    • 0342741262 scopus 로고    scopus 로고
    • MSc Thesis, Osaka University
    • H. Nakagawa, MSc Thesis, Osaka University, 1997.
    • (1997)
    • Nakagawa, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.