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Volumn 25, Issue 5, 2000, Pages 985-988

Line parameter measurements of trace gases in the near infrared region

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC POLLUTION; NEAR INFRARED; REMOTE SENSING; TRACE GAS;

EID: 0034091869     PISSN: 02731177     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0273-1177(99)00460-3     Document Type: Conference Paper
Times cited : (8)

References (20)
  • 10
    • 0001043994 scopus 로고
    • Measurements of intensities and self- and foreign-gas-broadened half-widths of spectral lines in the CO fundamental band
    • Nakazawa T., and M. Tanaka, Measurements of intensities and self- and foreign-gas-broadened half-widths of spectral lines in the CO fundamental band, J. Quant. Spectrosc. Radiat. Transfer, 28, 409 (1982).
    • (1982) J. Quant. Spectrosc. Radiat. Transfer , vol.28 , pp. 409
    • Nakazawa, T.1    Tanaka, M.2
  • 18
    • 0004322715 scopus 로고
    • 2 O in the 2.9 micron region
    • 2 O in the 2.9 micron region. J. Mol. Spectrosc., 40, 588 (1971).
    • (1971) J. Mol. Spectrosc. , vol.40 , pp. 588
    • Toth, R.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.