Cloud optical thickness and albedo retrievals from bidirectional reflectance measurements of POLDER instruments during ACE-2

Tellus, Series B: Chemical and Physical Meteorology

Volumn 52, Issue 2, 2000, Pages 888-908

  Parol, Frédéric ^a   Descloitres, Jacques ^a,b   Fouquart, Yves ^a  

^a Université des Sciences et Technologies de Lille   (France)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACE 2; ALBEDO; BIDIRECTIONAL REFLECTANCE; CLOUD MICROPHYSICS; OPTICAL DEPTH; POLDER;

EID: 0034083990     PISSN: 02806509     EISSN: None     Source Type: Journal    
DOI: 10.1034/j.1600-0889.2000.00026.x     Document Type: Article

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