Study on twin stacking faults in ultrafine nickel

Materials and Design

Volumn 21, Issue 3, 2000, Pages 155-157

  Liu, Ping ^a   Wang, Yuming ^a  

^a JILIN UNIVERSITY   (China)

Author keywords

TEM; Twin stacking faults; XRD

Indexed keywords

CRYSTAL MICROSTRUCTURE; ELECTRIC ARCS; POWDER METALS; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY; TWINNING; X RAY CRYSTALLOGRAPHY;

TWIN STACKING FAULTS;

NICKEL;

MICROSTRUCTURE; NICKEL;

EID: 0034078437     PISSN: 02641275     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0261-3069(99)00097-7     Document Type: Article

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