Digital high-resolution electron microscopy of atomic disordering in YB56

Journal of Electron Microscopy

Volumn 49, Issue 1, 2000, Pages 41-52

  Oku, Takeo ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Atomic detection; Digital analysis; High resolution electron microscopy; YB56

Indexed keywords

ATOMS; CERAMIC MATERIALS; CHEMICAL ELEMENTS;

ATOMIC ARRANGEMENT; ATOMIC DETECTION; ATOMIC POSITIONS; DIGITAL ANALYSIS; DOPING ATOMS; HIGH-RESOLUTION IMAGES; LIGHT ELEMENTS; LOCAL STRUCTURE; SOLID CLUSTERS;

HIGH RESOLUTION ELECTRON MICROSCOPY;

EID: 0034070649     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023790     Document Type: Article

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