TEM and SFM of exsolution and twinning in an alkali feldspar

American Mineralogist

Volumn 85, Issue 3-4, 2000, Pages 509-514

  Xu, Huifang ^a   Veblen, David R ^b   Buseck, Peter ^c   Ramakrishna, B L ^c  

^a UNIVERSITY OF NEW MEXICO   (United States)

^b JOHNS HOPKINS UNIVERSITY   (United States)

^c ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY;

ALKALI FELDSPAR; CLEAVAGE SURFACES; COHERENT BOUNDARIES; EXSOLUTION; HIGH-RESOLUTION TEM; IRIDESCENT COLORS; SURFACE HEIGHT; SURFACE STEPS;

FELDSPAR;

ALKALI FELDSPAR; CRYSTAL STRUCTURE; EXSOLUTION; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; TWINNING;

EID: 0034063945     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am-2000-0412     Document Type: Article

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