Residual stresses in thermal barrier coatings: Effects of interface asperity curvature/height and oxide thickness

Materials Science and Engineering: A

Volumn 283, Issue 1-2, 2000, Pages 46-55

  Hsueh, Chun Hway ^a   Fuller, Edwin R ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Analytical modeling; Coating; Numerical simulations; Residual stresses

Indexed keywords

CERAMIC COATINGS; COMPRESSIVE STRESS; COMPUTER SIMULATION; INTERFACES (MATERIALS); MATHEMATICAL MODELS; OXIDES; PLASMA SPRAYING; RESIDUAL STRESSES; TENSILE STRESS; THERMAL STRESS;

THERMAL BARRIER COATINGS; TOP COAT BOND COAT INTERFACE;

SPRAYED COATINGS;

ASPERITY; COATING; FILM THICKNESS; MATHEMATICAL MODELING; OXIDE FILM; RESIDUAL STRESS;

EID: 0034059558     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(00)00743-7     Document Type: Article

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