Determination of impurity elements in high purity graphite by inductively coupled plasma atomic emission spectrometry after microwave decomposition

Analyst

Volumn 125, Issue 6, 2000, Pages 1189-1191

  Watanabe, Mitsuyoshi ^a   Narukawa, Akira ^a  

^a NGK INSULATORS LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

GRAPHITE; NITRIC ACID; SULFURIC ACID;

ARTICLE; ATOMIC EMISSION SPECTROMETRY; DECOMPOSITION; MICROWAVE RADIATION;

EID: 0034040909     PISSN: 00032654     EISSN: None     Source Type: Journal    
DOI: 10.1039/b001608j     Document Type: Article

References (6)

1. 1 H. Hashitani, H. Yoshida, T. Adachi and K. Izawa, Bunseki Kagaku, 1986, 35, 911.
2. 2 K. Watanabe and J. Inagawa, Analyst, 1996, 121, 623.
3. 3 K. Watanabe and K. Takashima, Abstracts of the 51st Symposium on Analytical Chemistry, The Japan Society for Analytical Chemistry, Tokyo, 1990, p. 523.
4. 4 Y. Koshino and A. Narukawa, Analyst, 1993, 118, 827.
5. 5 K. Watanabe, K. Takashima, S. Tamura and Y. Toita, Abstracts of the 51st Symposium on Analytical Chemistry, The Japan Society for Analytical Chemistry, Tokyo, 1990, p. 431.
6. 6 Chemical Analysis of High Purity Graphite: Preparation of Certified Reference Materials and Development of Analytical Methods, Japan Atomic Energy Research Institute, Japan, 1993 Report JAERI-M 93-013.