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Journal of Materials Chemistry

Volumn 10, Issue 3, 2000, Pages 701-707

The system Ga2O3(Al2O3)-GeO2(SiO2) studied by NMR, XRD, IR and DTA

(2) Meinhold, Richard H a Mackenzie, Kenneth J D b

a UNIVERSITY OF AUCKLAND (New Zealand)

b UNIVERSITY OF OXFORD (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM SILICATE; GALLIUM; GERMANATE; UNCLASSIFIED DRUG;

ARTICLE; CHEMICAL REACTION KINETICS; CHEMICAL STRUCTURE; INFRARED SPECTROSCOPY; NUCLEAR MAGNETIC RESONANCE; REACTION ANALYSIS; THERMAL ANALYSIS; VOLATILIZATION; X RAY DIFFRACTION;

EID: 0034036298 PISSN: 09599428 EISSN: None Source Type: Journal
DOI: 10.1039/a907541k Document Type: Article

Times cited : (11)

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