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Volumn 10, Issue 5, 2000, Pages 1147-1150

Molecularly interconnected SiO2-GeO2 thin films: Sol-gel synthesis and characterization

Author keywords

[No Author keywords available]

Indexed keywords

GERMANIUM DIOXIDE; SILICON DIOXIDE;

EID: 0034033819     PISSN: 09599428     EISSN: None     Source Type: Journal    
DOI: 10.1039/a907247k     Document Type: Article
Times cited : (27)

References (34)
  • 23
    • 0002501491 scopus 로고
    • ed. A. Benninghoven, K. T. F. Jansen, J. Tumpner and H. W. Werner, Wiley, Chichester
    • 23 C. Pagura, S. Daolio and B. Facchin, in Secondary-Ion Mass Spectrometry SIMS VIII, ed. A. Benninghoven, K. T. F. Jansen, J. Tumpner and H. W. Werner, Wiley, Chichester, 1992, p. 239.
    • (1992) Secondary-Ion Mass Spectrometry SIMS VIII , pp. 239
    • Pagura, C.1    Daolio, S.2    Facchin, B.3
  • 25


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.