Preparation of highly ordered quinquethiophene thin films on TiO2 substrates

Journal of Materials Chemistry

Volumn 10, Issue 1, 2000, Pages 47-53

  Müller, Eckhard ^a   Ziegler, Christiane ^a  

^a UNIVERSITY OF TÜBINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

THIOPHENE DERIVATIVE; TITANIUM DIOXIDE;

ARTICLE; CHEMICAL STRUCTURE; CONDUCTANCE; CRYSTALLIZATION; EVAPORATION; FILM; SURFACE PROPERTY; TEMPERATURE DEPENDENCE;

EID: 0034030902     PISSN: 09599428     EISSN: None     Source Type: Journal    
DOI: 10.1039/a902471i     Document Type: Article

References (24)

1. 1 F. Garnier, R. Hajlaoui, A. Yassar and P. Srivastava, Science, 1994, 265, 1684.
2. 2 G. Horowitz, X. Z. Peng, D. Fichou and F. Garnier, J. Appl. Phys., 1990, 67, 528.
3. 3 H. E. Katz, , A. Dodabalapur and Z. Bao, in Handbook of Oligo-and Polythiophenes, ed. D. Fichou, Wiley-VCH, Weinheim, 1999, p. 459.
4. 4 M. Granström, , M. G. Harrison and R. Friend, in Handbook of Oligo-and Polythiophenes, ed. D. Fichou, Wiley-VCH, Weinheim, 1999, p. 405.
5. 5 Ch. Ziegler, in Handbook of Organic Conductive Molecules and Polymers, ed. H. Nalwa, Wiley, Chichester, 1997, p. 677; D. Fichou and Ch. Ziegler, in Handbook of Oligo-and Polythiophenes, ed. D. Fichou, Wiley-VCH, Weinheim, 1999, p. 183.
6. 5 Ch. Ziegler, in Handbook of Organic Conductive Molecules and Polymers, ed. H. Nalwa, Wiley, Chichester, 1997, p. 677; D. Fichou and Ch. Ziegler, in Handbook of Oligo-and Polythiophenes, ed. D. Fichou, Wiley-VCH, Weinheim, 1999, p. 183.
7. 6 F. Martinez, R. Voelkel, D. Naegele and H. Naarmann, Mol. Cryst. Liq. Cryst., 1989, 167, 227.
8. 7 O. Böhme, Ch. Ziegler and W. Göpel, Adv. Mater., 1994, 6, 587.
9. 8 O. Böhme, Ch. Ziegler and W. Göpel, Synth. Met., 1994, 67, 87.
10. 9 H.-J. Egelhaaf, P. Bäuerle, K. Rauer, V. Hoffmann and D. Oelkrug, Synth. Met., 1993, 61, 143.
11. 10 H.-J. Egelhaaf, P. Bäuerle, K. Rauer, V. Hoffmann and D. Oelkrug, J. Mol. Struct., 1993, 293, 249.
12. 11 H.-J. Egelhaaf and D. Oelkrug, SPIE, 1995, 2362, 398.
13. 12 J. Gierschner, H.-J. Egelhaaf and D. Oelkrug, Synth. Met., 1997, 84, 529.
14. 13 F. Van Bolhuis, H. Wynberg, E. E. Havinga, E. W. Meijer and E. G. J. Staring, Synth. Met., 1989, 30, 381.
15. 14 W. Porzio, S. Destri, M. Maschperga and S. Brückner, Acta Polym., 1993, 44, 266.
16. 15 W. Göpel, G. Rocker and R. Feierabend, Phys. Rev. B, 1983, 28, 3427.
17. 16 P. J. Møller and M.-C. Wu, Surf. Sci, 1989, 224, 265.
18. 17 K. D. Schierbaum, S. Fischer, P. Wincott, P. Hardman, V. Dhanak, G. Jones and G. Thornton, Surf. Sci, 1997, 391, 196.
19. 18 S. Fischer, J. A. Martin-Gago, E. Román, K. D. Schierbaum and J. L. de Segovia, J. Electron Spectrose. Relat. Phenom., 1997, 83, 217.
20. 19 J. Murr and Ch. Ziegler, Phys. Rev. B, 1998, 57, 7299.
21. 20 D. Oeter, Ch. Ziegler and W. Göpel, Synth. Met., 1993, 61, 147.
22. 21 W. Göpel, J. A. Anderson, D. Frankel, M. Jaehnig, K. Phillips, J. A. Schäfer and G. Rocker, Surf. Sci, 1984, 139, 333.
23. 22 H.-J. Egelhaaf, University of Tübingen, personal communication; H.-J. Egelhaaf, E. Müller, D. Oelkrug and Ch. Ziegler , in preparation. For similar measurements on glass and Si-wafer substrates, compare reference 5 and references therein.
24. 22 H.-J. Egelhaaf, University of Tübingen, personal communication; H.-J. Egelhaaf, E. Müller, D. Oelkrug and Ch. Ziegler , in preparation. For similar measurements on glass and Si-wafer substrates, compare reference 5 and references therein.