A system level partitioning approach for analyzing the origins of variability in life prediction of tungsten filaments for incandescent lamps

Materials and Design

Volumn 21, Issue 1, 1999, Pages 9-18

  Raj, R ^a   Enright, M P ^a   Frangopol, D M ^a  

^a UCB 450   (United States)

Author keywords

High temperature; Lifetime; Partitioning; Reliability; Tungsten; Variability

Indexed keywords

LIGHT;

EID: 0034015207     PISSN: 02641275     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0261-3069(99)00045-x     Document Type: Article

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