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Volumn 11, Issue 4, 2000, Pages 333-341
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Evaluation of the rotational temperature in N2 discharges using low-resolution spectroscopy
a
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Author keywords
Low resolution spectrometer; Rotational temperature of nitrogen; Thin film process
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Indexed keywords
BAND STRUCTURE;
MAGNETRONS;
NITROGEN;
SPECTROSCOPIC ANALYSIS;
THERMOANALYSIS;
LOW-RESOLUTION SPECTROSCOPY;
PLASMAS;
GAS;
NITROGEN;
PLASMA JET;
TEMPERATURE MEASUREMENT;
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EID: 0034013035
PISSN: 09570233
EISSN: None
Source Type: Journal
DOI: 10.1088/0957-0233/11/4/301 Document Type: Article |
Times cited : (27)
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References (16)
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