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Volumn 11, Issue 4, 2000, Pages 333-341

Evaluation of the rotational temperature in N2 discharges using low-resolution spectroscopy

Author keywords

Low resolution spectrometer; Rotational temperature of nitrogen; Thin film process

Indexed keywords

BAND STRUCTURE; MAGNETRONS; NITROGEN; SPECTROSCOPIC ANALYSIS; THERMOANALYSIS;

EID: 0034013035     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/11/4/301     Document Type: Article
Times cited : (27)

References (16)
  • 14
    • 85034740840 scopus 로고
    • Ecole Centrale de Paris
    • Repoux M 1991 Thèse Ecole Centrale de Paris
    • (1991) Thèse
    • Repoux, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.