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Volumn 43, Issue 1, 2000, Pages 15-32

Fast imaging of TDEM data based on S-inversion

Author keywords

Conductivity; Electromagnetic methods; Inverse problem; Transient methods

Indexed keywords

ELECTRIC CONDUCTIVITY; IMAGING TECHNIQUES; INVERSE PROBLEMS; MATHEMATICAL TRANSFORMATIONS; NUMERICAL ANALYSIS; TIME DOMAIN ANALYSIS;

EID: 0034009159     PISSN: 09269851     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0926-9851(99)00030-0     Document Type: Article
Times cited : (45)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.