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Volumn 80, Issue 1, 2000, Pages 29-43
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Current-induced instability in Cr-p+ a-Si:H-V thin film devices
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0033993113
PISSN: 13642812
EISSN: None
Source Type: Journal
DOI: 10.1080/014186300255744 Document Type: Article |
Times cited : (1)
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References (20)
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