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Volumn 107, Issue 1, 2000, Pages 263-277

Modeling of subcritical penetration into sediments due to interface roughness

Author keywords

[No Author keywords available]

Indexed keywords

WATER;

EID: 0033988775     PISSN: 00014966     EISSN: None     Source Type: Journal    
DOI: 10.1121/1.428303     Document Type: Article
Times cited : (50)

References (23)
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    • to be published
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.