Rapid search and quantitative analysis of gunshot residue particles in the SEM

Journal of Forensic Sciences

Volumn 45, Issue 1, 2000, Pages 83-92

  Lebiedzik, Jozef ^a,c   Johnson, David L ^b  

^a University of CO   (United States)

^b STATE UNIVERSITY OF NEW YORK   (United States)

^c NONE   (United States)

Author keywords

Automatic analyses; Back scattered electron (BSE) signal; Energy dispersive X ray analysis (EDX); Firearms discharge residue (FDR); Forensic science; Gunshot residue (GSR); Gunshot residue composition; Gunshot residue contamination; Imaging threshold standard; Scanning electron microscopy (SEM)

Indexed keywords

ARTICLE; ARTIFACT REDUCTION; AUTOMATION; DIAGNOSTIC ACCURACY; FORENSIC IDENTIFICATION; GUNSHOT INJURY; HUMAN; IMAGE ENHANCEMENT; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY;

EID: 0033986408     PISSN: 00221198     EISSN: None     Source Type: Journal    
DOI: 10.1520/jfs14644j     Document Type: Article

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