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Volumn 162, Issue 1-3, 2000, Pages 25-36
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A common theoretical basis for surface forces apparatus, osmotic stress, and beam bending measurements of surface forces
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Author keywords
Beam bending measurements; Osmotic stress; Pore morphology; Surface forces apparatus
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Indexed keywords
CHEMICAL EQUIPMENT;
MACROMOLECULES;
MORPHOLOGY;
OSMOSIS;
POROSITY;
SOLUTIONS;
SOLVENTS;
THIN FILMS;
BEAM BENDING MEASUREMENTS;
OSMOTIC STRESS;
SURFACE FORCES APPARATUS;
SURFACE PHENOMENA;
FORCE;
MECHANICS;
OSMOTIC STRESS;
PRIORITY JOURNAL;
REVIEW;
SOLVATION;
STATISTICAL ANALYSIS;
SURFACE PROPERTY;
THEORY;
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EID: 0033966978
PISSN: 09277757
EISSN: None
Source Type: Journal
DOI: 10.1016/S0927-7757(99)00253-8 Document Type: Article |
Times cited : (9)
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References (52)
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