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Volumn 162, Issue 1-3, 2000, Pages 25-36

A common theoretical basis for surface forces apparatus, osmotic stress, and beam bending measurements of surface forces

Author keywords

Beam bending measurements; Osmotic stress; Pore morphology; Surface forces apparatus

Indexed keywords

CHEMICAL EQUIPMENT; MACROMOLECULES; MORPHOLOGY; OSMOSIS; POROSITY; SOLUTIONS; SOLVENTS; THIN FILMS;

EID: 0033966978     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-7757(99)00253-8     Document Type: Article
Times cited : (9)

References (52)
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    • (1995) J. Phys. Chem. , vol.99 , pp. 5067
  • 38
    • 85020634879 scopus 로고
    • in: J.M. Drak, J. Klafter, R. Kopelman (Eds.), Materials Research Society
    • M. Lupkowski, F. van Swol, Dynamics of small systems, in: J.M. Drak, J. Klafter, R. Kopelman (Eds.), Materials Research Society, 1990, p. 19.
    • (1990) Dynamics of Small Systems , pp. 19
    • Lupkowski, M.1    Van Swol, F.2
  • 43
    • 4244202584 scopus 로고
    • Y. Rosenfeld, Phys. Rev. Lett. 63 (1989) 980, J. Chem. Phys. 98 (1993) 8120.
    • (1993) J. Chem. Phys. , vol.98 , pp. 8120


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.