Atomic force microscopy imaging of polycrystalline CuInSe2 thin films

Journal of Microscopy

Volumn 197, Issue 2, 2000, Pages 206-215

  Alberts, V ^a   Hillie, K T ^b   Demanet, C M ^b  

^a UNIVERSITY OF JOHANNESBURG   (South Africa)

^b UNIVERSITY OF TRANSKEI   (South Africa)

Author keywords

Atomic force microscopy; Polycrystalline CuInSe2; Solar cells; Statistical analysis

Indexed keywords

COPPER ALLOYS; GRAIN GROWTH; INDIUM ALLOYS; INDIUM COMPOUNDS; POLYCRYSTALLINE MATERIALS; STATISTICAL METHODS; STRUCTURAL PROPERTIES; THIN FILM SOLAR CELLS; THIN FILMS;

ABSORBER FILMS; ABSORBER MATERIAL; ATOMIC-FORCE-MICROSCOPY; GROWTH TECHNIQUES; HEIGHT DISTRIBUTION; MICROSCOPY IMAGING; POLYCRYSTALLINE; POLYCRYSTALLINE CUINSE2; ROOT MEAN SQUARE; THIN-FILMS;

ATOMIC FORCE MICROSCOPY;

COPPER DERIVATIVE;

ARTICLE; ATOMIC FORCE MICROSCOPY; FILM; IMAGING; PRIORITY JOURNAL; STATISTICAL ANALYSIS;

EID: 0033962595     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2000.00652.x     Document Type: Article

References (8)

1. 2thin films prepared by selenization of Cu-In films. J. Mater. Sci.: Mater. Electron. 7, 91-99.
2. 2Se treatment of CuIn alloys. J. Mater. Sci. 33, 2919-2925.
3. 2Se atmosphere. Semicond. Sci. Technol. 12, 217-223.
4. Dongmo, S., Vautrot, P. & Troyon, M. (1998) Correction of surface roughness measurements in SPM imaging. Appl. Phys. A, Mater. Sci. Process. 66, S819-S823.
5. 2. Thin Solid Films, 301, 115-121.
6. Stolt, L., Hedström, J., Kessler, J., Ruckl, M., Velthaus, K.O. & Schock, H.W. (1993) ZnO/CdS/CuInSe2 thin-film solar cells with improved performance. Appl. Phys. Lett. 62 (6), 597-598.
7. 2-based thin-film solar cells: 16.8% total-area 1-sun and 17.2% total-area 22-sun device performance. Proc. IEEE First World Conference on Photovoltaic Energy Conversion, pp. 1942-1945.
8. Westra, K.L. & Thomson, D.J. (1995) Effect of tip shape on the surface roughness from atomic force microscopy images of thin films. J. Vacuum Sci. Technol. B, 13 (2), 344-349.