Calculation of self-attenuation factors in gamma-ray spectrometry for samples of arbitrary shape

Journal of Radioanalytical and Nuclear Chemistry

Volumn 244, Issue 3, 2000, Pages 685-689

  Korun, M ^a  

^a JO EF STEFAN INSTITUTE   (Slovenia)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTIC METHOD; CONFERENCE PAPER; GAMMA SPECTROMETRY; MEASUREMENT; SPECTROMETER;

EID: 0033938730     PISSN: 02365731     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1006775029902     Document Type: Conference Paper

References (7)

1. R. G. HELMER, K. DEBERTIN, Gamma- and X-ray Spectrometry with Semiconductor Detectors, North Holland, Amsterdam, 1988.
2. M. KORUN, Czechosl. J. Phys., 49 (1999), Suppl. S1, 429.
3. M. KORUN, Appl. Radiation Isotopes, 50 (1999) 381.
4. ANSI/IEEE Standard 325 (1986).
5. J. H. HUBBELL, Intern. J. Appl. Radiation Isotopes, 33 (1982) 1269.
6. O. F. NEMEC, Yu. V. GOFMAN, Spravochnik po Yadernoy Fizike, Izdatel'stvo Naukova Dumka, Kiev, 1975.
7. M. ABRAMOVITZ, I. A. SEGUN (Eds), Handbook of Mathematical Functions, Dover Publications, Inc., New York, 1968.