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Volumn 16, Issue 6, 2000, Pages 653-655

Correlation between the relative sensitivity factors and the sputtering yields in glow-discharge mass spectrometry

Author keywords

[No Author keywords available]

Indexed keywords

MASS SPECTROMETRY;

EID: 0033936725     PISSN: 09106340     EISSN: None     Source Type: Journal    
DOI: 10.2116/analsci.16.653     Document Type: Note
Times cited : (10)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.