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Volumn 27, Issue 4, 2000, Pages 537-547
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A pattern measure
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Author keywords
[No Author keywords available]
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Indexed keywords
METHODOLOGY;
MODELING;
VISUAL ANALYSIS;
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EID: 0033925787
PISSN: 02658135
EISSN: None
Source Type: Journal
DOI: 10.1068/b2676 Document Type: Article |
Times cited : (31)
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References (7)
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