Evaluation of three software programs for calculating true-coincidence summing correction factors

Journal of Radioanalytical and Nuclear Chemistry

Volumn 244, Issue 3, 2000, Pages 675-680

  Van Sluijs, R ^a   Bossus, D ^a   Blaauw, M ^b   Kennedy, G ^c   De Wispelaere, A ^d   Van Lierde, S ^a,d   De Corte, F ^d  

^a DSM RESEARCH   (Netherlands)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

^d GHENT UNIVERSITY   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHM; ANALYTIC METHOD; COMPUTER ANALYSIS; COMPUTER PROGRAM; CONFERENCE PAPER; EVALUATION; NEUTRON ACTIVATION ANALYSIS; VALIDATION PROCESS;

EID: 0033921273     PISSN: 02365731     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1006718812155     Document Type: Conference Paper

References (8)

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8. K. DEBERTIN, R. HELMER, Gamma- and X-ray spectrometry with semiconductors, North-Holland, Amsterdam, 1988.