Growth of ZnS:Tm thin films by MOCVD

Journal of Crystal Growth

Volumn 208, Issue 1, 2000, Pages 259-263

  Hsu, Chin Tsar ^a  

^a NATIONAL FORMOSA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; FILM GROWTH; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MORPHOLOGY; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR DOPING; SEMICONDUCTOR GROWTH; THIN FILMS; X RAY CRYSTALLOGRAPHY;

HEXAFLUOROACETONATO-THULIUM; ZINC SULFIDE;

SEMICONDUCTING FILMS;

EID: 0033909229     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(99)00410-8     Document Type: Article

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