Wide field amplitude and phase confocal microscope with speckle illumination

Optics Communications

Volumn 174, Issue 1-4, 2000, Pages 75-80

  Somekh, M G ^a   See, C W ^a   Goh, J ^a  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FOCUSING; INTERFEROMETRY; OPTICAL SYSTEMS; PHASE SHIFT; SCANNING; SPECKLE;

PHASE SHIFTING INTERFEROMETRY; SCANNING CONFOCAL MICROSCOPY;

OPTICAL MICROSCOPY;

EID: 0033909019     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(99)00657-4     Document Type: Article

References (12)

1. T. Wilson, C.J. Sheppard, 1984. Theory and Practice of Scanning Optical Microscopy, Academic Press, New York.
2. Petran M.E., Hadravsky M., Egger M.D., Galambos R. J. Opt. Soc. Am. 58:1968;661.
3. Wilson T., Juskaitis R., Neil M.A.A., Kozubek M. Opt. Lett. 21:1996;1879.
4. Neil M.A.A., Juskaitis R., Wilson T. Opt. Lett. 22:1997;1905.
5. Sommargren G.E. Appl. Opt. 20:1981;610.
6. Wickramasinghe H.K., Ameri S., See C.W. Electron. Lett. 189:1982;973.
7. Somekh M.G., Valera M.S., Appel R.K. Appl. Opt. 34:1995;4857.
8. Somekh M.G. J. Microsc. 168:1992;131.
9. Holmes R.D., Somekh M.G. Appl. Opt. 33:1994;654.
10. J.E. Grievencamp, Opt. Eng., 1984, 350.
11. Chim S.S.C., Kino G.S. Appl. Opt. 30:1991;2197.
12. Hopkins H.H. Proc. R. Soc. A. 217:1953;408.