TEM, XPS and SIMS analyzes on grain boundary of lanthanum chromites

Journal of Electroceramics

Volumn 4, Issue SUPPL. 1, 1999, Pages 121-128

  Sakai, Natsuko ^a   Tsunoda, Tatsuo ^c   Fukumoto, Natsuo ^c   Kojima, Isao ^c   Yamaji, Katsuhiko ^c   Horita, Teruhisa ^c   Ishikawa, Masahiko ^c   Yokokawa, Harumi ^c   Dokiya, Masayuki ^b  

^a NATL INST OF MAT AND CHEM RES   (Japan)

^b YOKOHAMA NATIONAL UNIVERSITY   (Japan)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; ELECTRON ENERGY LEVELS; GRAIN BOUNDARIES; INTERDIFFUSION (SOLIDS); LANTHANUM COMPOUNDS; MORPHOLOGY; POSITIVE IONS; SECONDARY ION MASS SPECTROMETRY; TRANSMISSION ELECTRON MICROSCOPY; TRANSPORT PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY;

LANTHANUM CHROMITE; VALENCE STATE;

CHROMITE;

EID: 0033908904     PISSN: 13853449     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1009971028329     Document Type: Article

References (14)